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National Instruments

Automotive Research User Handbook

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Within the next 10 years, we will see remarkable change in the automotive industry from improved engine efficiency to autonomous vehicles to electrification. National Instruments is proud to partner with leading institutions driving these changes. This curated handbook summarizes and provides access to six case studies...

Published: Aug 14, 2019
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National Instruments

Key Considerations for Powertrain HIL Test

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Safety, availability, and cost considerations can make performing thorough tests of embedded control devices using the complete system impractical. Hardware-in-the-loop (HIL) simulation is a real-time test technique used to test these devices more efficiently. During HIL test, the physical system that interfaces...

Published: May 01, 2019
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ON Semiconductor

Addressing Thermal Challenges in High‐Density Power Applications

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Demand for more features and higher performance from ever-smaller form factors presents significant challenges for engineers developing applications such as DC-DC conversion, computing, industrial motor drives, and telecommunications. In many cases, for example, enhancing capabilities and functionality can lead to the...

Published: Feb 21, 2019
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Nordic Semiconductor

Security Threat in Bluetooth LESC Pairing

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The CERT Division has published a Vulnerability Note titled Bluetooth implementations may not sufficiently validate elliptic curve parameters during Diffie-Hellman key exchange. It describes a man-in-the-middle attack on the pairing procedures in  Bluetooth®  Secure Pairing and Bluetooth LE Secure Connections....

Published: Feb 21, 2019
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National Instruments

Selecting an Approach to Build Flexible, Cost-Effective ECU Production Test Systems

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ECUs became a standard component in most vehicles. As a computer designed to solve a very specific problem, the ECU is a fundamental component in an automobile. Modern vehicles can contain over 100 ECUs with many different purposes. This white paper explores different approaches to test automotive electronic control...

Published: Feb 19, 2020
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BlackBerry QNX

Ten Principles for Building Safe Embedded Software Systems

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Obtaining safety certifications and pre-market approvals for safety-related systems is arduous, costly, and prone to failure. And yet such certifications and approvals are integral to the sale and market acceptance of software for a wide range of products. Further, safe system design continues to evolve as embedded...

Published: Feb 04, 2021
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National Instruments

Key Considerations for Powertrain HIL Test

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Safety, availability, and cost considerations can make performing thorough tests of embedded control devices using the complete system impractical. Hardware-in-the-loop (HIL) simulation is a real-time test technique used to test these devices more efficiently. During HIL test, the physical system that interfaces...

Published: Feb 19, 2020
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Rohde & Schwarz

Gate Drive Measurement Considerations

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The more successful a gate driver is in reducing power-up and power-down times, the bigger the headache for accurate measurements. Both choosing the right probe and optimizing the probing technique are significant factors in improving measurement accuracy. This whitepaper provides guidelines.

Published: Jun 04, 2020
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Mouser Electronics

Understanding the Basics: A Technology Guide for Component Buyers

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The sourcing of electronics components is a complicated process. Modern-day designs are becoming increasingly complex as the technology they utilise advances. For the engineer, product selection can involve significant research: checking datasheet specifications, investigating second-source options, determining fit into...

Published: Jul 20, 2020
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National Instruments

5G mmWave Semiconductor Device Test

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To achieve some of the ambitious Key Performance Indicators of 5G enhanced Mobile Broadband, semiconductor devices for 5G infrastructure need to empower reliable multi-user MIMO (MU-MIMO) functionality at mmWave frequencies with larger channel bandwidths. 5G base stations achieve this spatial multiplexing by employing...

Published: Nov 04, 2019
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National Instruments

Fundamentals of Building a Test System

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Most organizations do not consider production test a top priority, but it is a necessity to prevent major quality issues in the products that represent the company brand in the hands of customers.The costs, however, can be significant and are often greatly misunderstood, especially when there’s no...

Published: Feb 19, 2020
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Rohde & Schwarz

Designing for EMI testing (step-by-step guide): Improve your time to market with oscilloscopes

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Today, R&D engineers face challenging time-to-market goals. Extending the product development schedule and delaying the product launch can prove to be extremely costly in terms of opportunity cost and lost market share. Nearly 50% of products fail EMC compliance the first time. Every day spent on debugging, isolating...

Published: Jun 04, 2020
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National Instruments

Engineer’s Guide to 5G Semiconductor Test

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This paper assumes a basic familiarity with the 5G physical layer; it focuses on the new challenges of testing semiconductor devices for wideband 5G applications. The enhanced mobile broadband (eMBB) use case points to supporting greater user data rates and increased system capacity. Departing from legacy 3G and 4G cellular...

Published: Aug 14, 2019
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TTI

An Engineer’s Guide to Understanding Connector for use in Harsh Industrial Environments

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Connectors are often seen as the weakest link between sub-systems, and sometimes this is rightly so. This can be as a result of underspecifying the connector system or not appreciating the difference between the various rating schemes. As a result engineers tend to over-specify the connectors to ensure they are reliable...

Published: Feb 15, 2019
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Hyperstone

Fundamentals of Reliable Flash Storage: An Introduction to Security

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Not a single day passes without major news of data breaches. Whether it is database theft or taking control of systems, with the internet of things, the threats become even higher. Ensuring that data is secure from unauthorized access during storage and during transfer is one of the main challenges of the connected world...

Published: May 20, 2020
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Rohde & Schwarz

Power supply control loop response measurements (Bode plot)

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To ensure the stability of voltage regulators and switchedmode power supplies, the control loop behavior must be measured and characterized. A well compensating voltage controller enables stable output voltages and reduces the influence of load changes and supply voltage variations. The quality of this control circuit...

Published: Jun 04, 2020
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